Ellipsometry is a total optical measurement technique. This method is employed to measure how the polarization of light changes when passing through a medium. The polarized light shows distortion ...

Spectroscopic ellipsometry is widely adopted in semiconductor processing, such as in the manufacturing of integrated circuits, flat display panels, and solar cells. However, a conventional ...

insights from industryArash MirhamedLead of ISE Support TeamPark Systems In this interview, Arash Mirhamed, lead of the ISE Support Team at Park Systems, explores how imaging spectroscopic ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

A new technical paper titled “Ultra-wide-field imaging Mueller matrix spectroscopic ellipsometry for semiconductor metrology” was published by researchers at Samsung. “We propose an ultra-wide-field ...

Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, these materials ...

Researchers typically use Raman spectroscopy to check the structural quality and thickness of graphene, but because the technique can only cover a small area in a given time, it’s painfully slow. It ...

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In semiconductor device applications, there is an increasing demand for semiconductors with very high carrier concentrations. The semiconductor material parameters, namely carrier density and mobility ...

The Ellipsometry is a total optical measurement method. This technique is used to measure the change of polarization of light when passing through a medium. Due to the layer structure during ...